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AAS MICROFICHE SERIES
Total Dose, Displacement Damage and Single Event Effects in the Radiation Hardened CMOS APS HAS2
By: Dirk Van Aken, Dominique Hervé and Matthieu Beaumel.
Pub. 2010, 14pgs.
PDF File. AAS 10-022.
Price: $29.00
 

Reprinted from Advances in the Astronautical Sciences Volume 137.

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