Logo
Univelt, Inc.

  Home    FAQ    Contact   Events   Affiliates   Cart   Conferences 
ADVANCES IN THE ASTRONAUTICAL SCIENCES
SCIENCE & TECHNOLOGY
AAS HISTORY
OTHER UNIVELT PUBLICATIONS
NASA
APOGEE
OTHER SPACE BOOKS
AAS PAPERS
AAS MICROFICHE SERIES
Application of New Debris Risk Evolution and Dispersal (Dread) Tool to Characterize Post-Fragmentation Risk
By: Daniel L. Oltrogge and David A. Vallado.
Pub. 2018, 20pgs.
PDF File. AAS 17-600.
Price: $29.00
 

Reprinted from Advances in the Astronautical Sciences Astrodynamics 2017, Volume 162.

This item is an electronic document and will be delivered by email to the address you provide within two business days.